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TTTC's Electronic Broadcasting
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2nd IEEE International Workshop on Silicon Debug and
Diagnosis - SDD05 |
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CALL FOR
PAPERS | |
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Troubleshooting how and why circuits and systems fail is important and is rapidly growing in industry significance. Debug and diagnosis may be needed for yield improvement, process monitoring, debugging the design function, failure mode learning for R&D, or just getting a working first prototype. But the detective work can become tricky. Sources of difficulty include, circuit complexity, packaging, physical access, shortened product creation cycle, the traditional focus on just pass/fail testing and missing tool and equipment capabilities. New and efficient solutions for debug and diagnosis will have a much needed and highly visible impact on productivity. The mission and objective of the SDD05 Workshop is to consider all issues related to debug and diagnosis of circuits and systems - from prototype bring-up to volume production. The topics of interest include, but are not limited to, the following:
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The workshop objective is to facilitate a valuable interactive information exchange. Both extended abstracts and full papers are acceptable for submission. The length guideline is 3 to 8 pages. Submissions must include a title, keywords, full name and affiliation of all authors and an abstract of roughly 50 words. Clearly describe the idea, value, methods, results, originality, value, and benefits over other methods. Proposals that describe open issues, industry/technology needs or opinions are also welcome. Please identify a primary contact and include their address, phone number, fax number and email address. Submit all submissions (PDF or MS Word format) to the SDD web-site by August 1st, 2005. Authors will be notified of the status of their submissions by September 9th. Final papers are due October 3rd for inclusion in the informal digest of papers. Proposals for discussion panels and other special sessions are also invited. Please include a title, name and contact information of the session organizer, a 1 page abstract, and a list of prospective participants. Please submit these to the web site or contact the Program/Special-Session Chairs. For general
information contact: For submission
information contact: | |
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General Chair Program Chair Special Sessions Finance Local Arrangement Chair Electronic Media Program Committee Steering Committee | |
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For more information, visit us on the web
at: http://evia.ucsd.edu/conferences/sdd/ | |
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The 2nd IEEE International Workshop on Silicon Debug and Diagnosis - SDD05 is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). | |
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IEEE Computer Society– Test Technology
Technical Council | ||
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FINANCE CHAIR IEEE DESIGN & TEST
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